Wafer Auto Inspection OM (PRO)

全自動晶圓檢查機 (進階款)

降低操作人員觸碰到晶圓,而造成晶圓髒污或受損的機率。

Advantages of this machine:

  • 台灣在地開發製造,可降低設備成本。
  • With macro inspection (Macro) and micro inspection (Micro).
  • 可依照需求搭配不同的光學系統。
  • 檢測站點可切換自動/手動。
  • Can do simple manual measurement.
  • NG sites are reproducible.
  • 半開放式架構,可隨時觀察機臺狀況。

 

* 本機為進階型晶圓檢查機,需更多功能可進一步諮詢客製化。

 

 

 

Equipment category

Description

 

 Description of this machine:

Wafer size
12″ 晶圓,可選擇8″、12″共用loadport。(可客製符合其他晶圓尺寸)   

 

Wafer load/unload module
晶圓數片(Mapping)功能,可有效偵測有片、無片、錯片、凸片及疊片(晶圓無翹曲)

 

Aligner Module (Aligner)
  • It can do micron-level precise alignment for transparent or non-transparent sheets.
  • 自動對圓心,可依Notch、十字mark、特徵,做角度擺正。

 

巨觀檢測 ( Macro Inspection ) Macro Inspection
  • The light source can be selected according to customer needs.
  • For personnel to visually inspect the front, back, and back edges.
  • The joystick can be adjusted manually, and the rotation angle can be adjusted arbitrarily. The inspection angle can also be set, and the angle can be automatically rotated and adjusted.
  • Can do NG film records.
  • The station can be selected and used according to the process.

 

微觀檢測 ( Micro Inspection ) Micro Inspection
  • Can do simple manual measurement.
  • The joystick can be manually controlled to move the stage to any position for inspection.
  • The electric stage can set multi-point inspection points and perform automatic inspection.
  • The software can record NG points with reproducibility.
  • The station can be selected and used according to the process.

 

control element
PC BASE

 

Optional requirements ( Option )
  • 量測軟體升級成自動量測
  • 軟體升級成AOI檢測
  • 晶圓翹曲片處理(<10mm)
  • 支援 Mapping file 功能
  • Wafer ID (OCR limited Semi standard font)
  • 讀取Barcode/RFID/2D code
  • 深度量測。
  • 晶圓厚度量測。
  • 跨境量測。
  • 光學尺。
  • 靜電解決方案。
  • 資訊傳輸系統(SECS/GEM)

 

 

 

 

 

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